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Author
:
David Schroeter
Publications
Noise measurements on MnSi thin films
Merlin Mitschek
,
David Schroeter
,
Dirk Menzel
,
Stefan Süllow
and
Jens Müller
EasyChair Preprint 1207
Keyphrases
1/f noise
,
Fluctuation Spectroscopy
,
Skyrmions
,
thin films
.
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