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Author:Ying-Hua Chu

Publications
Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant
Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu and Chia-Tso Chao
EasyChair Preprint 15192
Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant
Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu and Chia-Tso Chao
EasyChair Preprint 15192

Keyphrases

Defective parts per million (DPPM), Geographical part average testing (GPAT), Good-die-in-bad-neighborhood (GDBN), Latent defect, neural network.

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